High res TEMs from UIUC
Here are some high resolution TEM images from a SiMPore-UIUC collaborator.
Chris says:
The high resolution stuff looks pretty cool, especially the zoom-in on the 8nm pore. I the most obvious crystal planes are <111> with 0.314 nm spacing. If you look carefully, some 0.192 nm <110> planes and 0.136 nm <100> planes can also be seen. For reference, the Si-Si bond length is 0.235 nm.


very interesting. are you saying that the lattice spacings are exactly what the textbook values give? are the nanocrystals large enough to allow a precise measurement? can we deduce the nanocrystal size and shape from such images? or would twinning and other phenomena make this impossible?
The lattice spacings are within reasonable error of the textbook values, but obviously strains of a few % cannot be judged by the image alone. I usually try to measure the distance covered by 10 lattice fringes, and ten divide by 10 to get the average spacing.
Judging size/shape is a bit arbitrary and will likely vary with the focus position. However, approximate sizes and twin density in a set of nanocrystals could probably be reasonably estimated. Selected area diffraction patterns could provide additional data.