Surface topology of amorphous silicon films deposited at different substrate biases
We have always speculated that applying a substrate bias during the silicon deposition “smooths” the film by creating a nicer film. With Graham’s help, I took a few AFM scans of films deposited at three different biases: 00, 05, and 50W. (a) 00 W: 0.337 nm RMS (b) 05 W: 0.145 nm RMS (c) 50…