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Manipulating neutrophil migration through the vascular barriers
For last many months, I am working on neutrophil migration experiments to develop protocols to inhibit them from traversing the basement membrane. My previous blogs are here and here. I want to prevent neutrophils from crossing the endothelial basement membrane (BM), and record the changes in TEER and try to correlate with the gain in…
DI water buffer or thiol passivation?
ByJimI hope to bring this question to our group meeting. As we discussed before, we know that Cl- can be absorbed at the gold surface to screen the applied positive charge. We are using R6G as the filtration species, which is positively charged. So we must either use DI water as the buffer solution (we…
Exosome Scale Experiments
ByAslanHello Everyone, I have been working with Track Etched membranes since last year and we always had problems with leaking and also not being able to push the flow through the membrane. At the end of the summer, i decided to test my new idea for my devices and finally i have a system which…
Variation of TEER values during cell growth in microfluidic device
In my previous posts so far, I performed simulations to understand the behavior of TEER variation upon changes in electrode and membrane configuration. None of those models addresses the effects of cell growth on the TEER values. In real experiments, people measure the TEER of system before adding the cells (background TEER), and then monitor…
NPN Liftoff Update – 7/7/16
The NSF STTR phase I project officially ended last week, and we are writing the final report and preparing to submit a Phase II proposal. I will attempt here to summarize the program achievements and list some of the persisting technical issues we are facing. Program Technical Objectives: Optimize nanoporous silicon nitride (NPN) membrane properties…
W648: Burst Pressure and the Return of Contamination?
We received W648 from the production team this week. Upon inspection of this wafer, is has a higher density of pinholes than we have been seeing lately (>3 pinholes/slit compared to 0 or 1/slit) and seems to show a return of contamination, shown below. This contamination is visible over the entire wafer, but is easiest…
