NPN and pnc-Si deflection tests

I went over to RIT to work with JP on measuring the deflection of NPN and pnc-Si membranes as a function of pressure.  JP and Dave Fang did this work years ago, and we want to pick it up again to correlate with Sarah’s burst pressure data.

We used the Veeco Wyko (white light interferometer) to measure the amount of deflection at the center of the membrane for a given pressure.  Dave’s thesis first looks at the deflection of a SiN membrane with nanopores and from that he calculates Young’s Modulus (208 GPa)and the residual stress (200 MPa) of SiN.  (below)

From David Fang's thesis
From David Fang’s thesis

Next he presents data on pnc-Si with three different window sizes.  Notice, there is only data for pressures up to about 2 psi (6895 Pa = 1 psi)

pnc-Si deflection
pnc-Si deflection

He fits the above curves with an equation found in a paper by Vlassak to get the Young’s Modulus and Residual Stress of pnc-Si in the following table.

Table of Contents of materials properties
Table of Contents of materials properties

We repeat these tests with chips from the same wafers Sarah used for her burst pressures studies and get the following plots:

Deflection tests
Deflection tests

 

Deflection (closeup of ~100 um membranes)
Deflection (closeup of ~100 um membranes)

I typically started at low pressures and increased to 10 psi.  On some samples, I reduced the pressure after 10 back down to 2 psi or so to verify that the membrane had not been plasticly deformed.  They always returned to the same deflection at lower pressures.

I next tried to fit these curves with equations from Vlassak and Timoshenko.  In order to do that, I measured the actual window size of each chip and they are summarized in the tables below.  The coordinates are Sarah’s label so she can reference each samples location on a wafer.  (The A,B, C is because I didn’t have coordinates for a few)

pnc-Si window sizes
pnc-Si window sizes
NPN window sizes
NPN window sizes
NPN window sizes
NPN window sizes
NPN window sizes
NPN window sizes

I used the Young’s Modulus and Poisson’s ratio reported in literature.  In general, the Young’s modulus of a porous material is Eporous= Ebulk (1-porosity)

pnc-Si modeled
pnc-Si modeled

I haven’t actually looked at the original Timoshenko work, but the equation was provided in a paper by van Rijn.   vanRijn-1997-Deflection and maximum load of mi

The equation looks like this:

Timoshenko model of square plate bending
Timoshenko model of square plate bending

And the Vlassak paper 1992 Vlassak has a model for square and rectangular windows:

Square model
Square model
Rectangular model
Rectangular model

The function g(v,b/a) is provided in the following plot:

g(v,b/a)
g(v,b/a)

But our aspect ratios are pretty close to one so we can focus on the steep section of the curve to the left:

g(v,b/a)
g(v,b/a)

I did a linear fit to the line from 1-1.4 and got g(v,b/a)= -0.4125 (b/a)^2 +1.3225 (b/a) – 0.093.

-All of the models do a pretty good job at low pressures, but then underestimate the deflection at higher pressures.

-These models don’t account for residual stress.  (But Vlassak does provide a method for calculating the residual stress once the experimental data is fit.)

-The difference between the experimental data and the models are consistent between different window sizes and different materials.

I want to try a model where the young’s modulus reduces as deflection increases.  I assume the porosity increases with deflection, so by our earlier equation, E may as well.  The thickness may decrease as well, compounding the effect.

 

 

 

 

 

 

 

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