Wafer 1059: Burst Pressure Analysis

The following data is from analysis of Wafer #1059, consisting of 30nm pnc-Si with 7% porosity and an average pore diameter of 28nm. Square window sizes with sides lengths of 0.1mm, 0.3mm, 0.5mm, 0.7mm, and 0.9mm were tested. For 1.1mm x 1.1mm windows, burst pressures could not be determined, as these windows did not etch all the way.

Below, a map and key of defects on this wafer are shown. In general, chips with pinholes had lower burst pressures than those without pinholes.

SW_Wafer_1059_Map_Defects

 

The following map shows burst pressure ranges for chips with no apparent defects. Within a certain window size, darker colors correspond to weaker burst pressures, and brighter colors correspond to higher burst pressures.

SW_Wafer_1059_Map_BP

 

Overall, when analyzing data from the good chips, higher burst pressures corresponded to smaller window areas.

SW_Wafer_1059_BPvsSideLength

SW_Wafer_1059_BPvsArea

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